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Photoionization of the outer electrons in noble gas endohedral atoms

Journal Article · · Journal of Experimental and Theoretical Physics
 [1];  [2]
  1. Academy of Sciences of the Republic of Uzbekistan, Arifov Institute of Electronics (Uzbekistan)
  2. Russian Academy of Sciences, Ioffe Physicotechnical Institute (Russian Federation)

We suggest a prominent modification of the outer shell photoionization cross section in noble gas (NG) endohedral atoms NG-C{sub n} under the action of the electron shell of fullerene C{sub n}. This shell leads to two important effects: a strong enhancement of the cross section due to fullerene shell polarization under the action of the incoming electromagnetic wave and to prominent oscillation of this cross section due to the reflection of a photoelectron from the NG by the fullerene shell. Both factors lead to powerful maxima in the outer shell ionization cross sections of NG-C{sub n}, which we call giant endohedral resonances. The oscillator strength reaches a very large value in the atomic scale, 25. We consider atoms of all noble gases except He. The polarization of the fullerene shell is expressed in terms of the total photoabsorption cross section of the fullerene. The photoelectron reflection is taken into account in the framework of the so-called bubble potential, which is a spherical {delta}-type potential. It is assumed in the derivations that the NG is centrally located in the fullerene. It is also assumed, in accordance with the existing experimental data, that the fullerene radius R{sub C} is much larger than the atomic radius r{sub A} and the thickness {delta}{sub C} of the fullerene shell. As was demonstrated recently, these assumptions allow us to represent the NG-C{sub n} photoionization cross section as a product of the NG cross section and two well-defined calculated factors.

OSTI ID:
21241963
Journal Information:
Journal of Experimental and Theoretical Physics, Journal Name: Journal of Experimental and Theoretical Physics Journal Issue: 2 Vol. 107; ISSN JTPHES; ISSN 1063-7761
Country of Publication:
United States
Language:
English