Molecular dynamics simulations of organic SIMS with Cu{sub n} (n=1-3) clusters

Journal Article · Thu Jun 10 00:00:00 EDT 1999 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.59163· OSTI ID:21207971

Townes, J A; White, A K; Krantzman, K D ^[1]; Garrison, B J ^[2]

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1. Department of Chemistry and Biochemistry, College of Charleston, Charleston, South Carolina 29424 (United States)
2. Department of Chemistry, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States)

Molecular dynamics simulations have been performed to study the effect of cluster size on the emission yield and damage cross section in organic SIMS. A model system composed of a monolayer of biphenyl molecules on a Cu(001) substrate was bombarded with Cu{sub n} (n=1-3) projectiles at kinetic energies of 0.100 keV per atom. The yield increases with cluster size, but a nonlinear enhancement in yield is not observed. The yield-to-damage ratio, on the other hand, increases with the use of clusters, indicating that clusters have the potential to improve the sensitivity of SIMS.

• OSTI ID: 21207971
• Journal Information: AIP Conference Proceedings, Vol. 475, Issue 1; Conference: 15. international conference on the application of accelerators in research and industry, Denton, TX (United States), 4-7 Nov 1998; Other Information: DOI: 10.1063/1.59163; (c) 1999 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ATOM-MOLECULE COLLISIONS
ATOMIC CLUSTERS
ATOMS
BIPHENYL
CLUSTER BEAMS
COMPUTERIZED SIMULATION
COPPER
CRYSTAL STRUCTURE
FORMATION DAMAGE
KEV RANGE
KINETIC ENERGY
MASS SPECTROSCOPY
MOLECULAR CLUSTERS
MOLECULAR DYNAMICS METHOD
MOLECULES
NONLINEAR PROBLEMS
POTENTIALS
SUBSTRATES
THIN FILMS
YIELDS