A high intensity electron beam ion trap for charge state boosting of radioactive ion beams
Journal Article
·
· AIP Conference Proceedings
- Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
A high intensity electron beam ion trap under development at LLNL could be adapted for charge state boosting of radioactive ion beams, enabling a substantial reduction in the size and cost of a post-accelerator. We report estimates of the acceptance, ionization time, charge state distribution, emittance, and beam intensity for charge state boosting of radioactive ions in this device. The estimates imply that, for tin isotopes, over 10{sup 10} ions/s can be ionized to q=40+ with an absolute emittance of approximately 1 {pi} mm mrad at an energy of 30xq keV.
- OSTI ID:
- 21205581
- Journal Information:
- AIP Conference Proceedings, Vol. 475, Issue 1; Conference: 15.International conference on the application of accelerators in research and industry, Denton, TX (United States), 4-7 Nov 1998; Other Information: DOI: 10.1063/1.59151; (c) 1999 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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