Effect of Sm and Mg co-doping on the properties of ceria-based electrolyte materials for IT-SOFCs
Journal Article
·
· Materials Research Bulletin
- College of Material Science and Engineering, Nanjing University of Technology, No. 5 Xinmofan Road, Nanjing, Jiangsu 210009 (China)
Samples of Sm and Mg co-doped ceria electrolytes of Ce{sub 0.8}Sm{sub 0.2-x}Mg{sub x}O{sub 2-{delta}} (x = 0, 0.05, 0.10, 0.15 and 0.20) were sintered from powders obtained by solid-state reaction method. The structures and electrical properties were characterized by X-ray diffraction (XRD) and AC impedance spectroscopy (IS). The thermal expansion curves of samples were measured and the thermal expansion coefficients between 100 and 800 deg. C were calculated. Results showed that co-doping with appropriate ratio of Sm and Mg can improve the electrical performance of ceria-based electrolytes. As the substitution amount of Mg for Sm increased up to 50 mol%, the conductivity of the samples maintained almost unchanged or even slightly higher than that doped only with Sm in intermediate temperature. The results suggest that the materials cost for producing the ceria-based intermediate temperature solid oxide fuel cells (IT-SOFCs) may be significantly reduced owing to the cost difference between Mg and Sm.
- OSTI ID:
- 21199724
- Journal Information:
- Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 4 Vol. 44; ISSN MRBUAC; ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
CERIUM OXIDES
DOPED MATERIALS
ELECTROLYTES
IMPEDANCE
IONIC CONDUCTIVITY
MAGNESIUM COMPOUNDS
PERFORMANCE
SAMARIUM COMPOUNDS
SOLID OXIDE FUEL CELLS
SPECTROSCOPY
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
TEMPERATURE RANGE 1000-4000 K
THERMAL EXPANSION
X-RAY DIFFRACTION
CERIUM OXIDES
DOPED MATERIALS
ELECTROLYTES
IMPEDANCE
IONIC CONDUCTIVITY
MAGNESIUM COMPOUNDS
PERFORMANCE
SAMARIUM COMPOUNDS
SOLID OXIDE FUEL CELLS
SPECTROSCOPY
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
TEMPERATURE RANGE 1000-4000 K
THERMAL EXPANSION
X-RAY DIFFRACTION