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Transmission electron microscopy and electrical transport investigations performed on the same single-walled carbon nanotube

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.56498· OSTI ID:21199273
; ;  [1]
  1. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstr. 1, D-70569 Stuttgart (Germany)
Electrical transport measurements and high resolution transmission electron microscopy performed on the same (rope of) single-walled carbon nanotube(s) (SWCNTs) allow to establish links between structural and electronic properties of the tubes. The tubes are deposited on electron transparent ultrathin Si{sub 3}N{sub 4}-membranes bearing Cr/AuPd-electrodes defined by electron beam lithography. TEM-micrographs of the setup reveal mostly ropes consisting of 2-3 tubes which also appear on a scanning force microscope image of the same area. A current-voltage trace of the ropes at 4.2 K is also presented.
OSTI ID:
21199273
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 442; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English