Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

On the possibility of controlling the wave front of a wide-aperture HF(DF) laser by the method of Talbot interferometry

Journal Article · · Quantum Electronics (Woodbury, N.Y.)
;  [1]; ; ; ;  [2]
  1. A.A.Raspletin Almaz Research and Production Association, Moscow (Russian Federation)
  2. A.M. Prokhorov General Physics Institute, Russian Academy of Sciences, Moscow (Russian Federation)
The possibility of using the method of Talbot interferometry to control the wave fronts of wide-aperture pulsed HF(DF) lasers is studied experimentally. A search for sensitive screens for visualisation of radiation from a HF(DF) laser and other IR lasers is performed. Screens based on fine graphite powder on a rigid substrate proved to be most convenient for recording Talbot interferograms (talbotgrams). The emission of screens excited by laser pulses was detected with a digital photographic camera and images were processed in a PC. High-contrast talbotgrams of multifrequency radiation of a HF laser were obtained, demonstrating the possibility of controlling the wave fronts of HF(DF) lasers by the method of Talbot interferometry without separating an individual laser line. (interferometry)
OSTI ID:
21185844
Journal Information:
Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 1 Vol. 38; ISSN 1063-7818
Country of Publication:
United States
Language:
English

Similar Records

Visualisation of the wave-front deformations caused by a phase object by the method of successive double lateral shear interferometry
Journal Article · Wed Mar 30 23:00:00 EST 2005 · Quantum Electronics (Woodbury, N.Y.) · OSTI ID:21470725

Computational and experimental study of a Q-switched cw chemical HF/DF laser
Journal Article · Sat Jun 30 00:00:00 EDT 2007 · Quantum Electronics (Woodbury, N.Y.) · OSTI ID:21466688

HF and DF laser action by a pulsed microwave discharge
Journal Article · Thu Jun 01 00:00:00 EDT 1978 · IEEE J. Quant. Electron.; (United States) · OSTI ID:6513428