Use of a Linear Paul Trap to Study Random Noise-Induced Beam Degradation in High-Intensity Accelerators

Journal Article · Fri Apr 10 00:00:00 EDT 2009 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.102.145003· OSTI ID:21180362

Chung, Moses; Gilson, Erik P; Davidson, Ronald C; Efthimion, Philip C; Majeski, Richard ^[1]

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1. Accelerator Physics Center, Fermi National Accelerator Laboratory, Batavia, Illinois 60510 (United States)

A random noise-induced beam degradation that can affect intense beam transport over long propagation distances has been experimentally studied by making use of the transverse beam dynamics equivalence between an alternating-gradient (AG) focusing system and a linear Paul trap system. For the present studies, machine imperfections in the quadrupole focusing lattice are considered, which are emulated by adding small random noise on the voltage waveform of the quadrupole electrodes in the Paul trap. It is observed that externally driven noise continuously produces a nonthermal tail of trapped ions, and increases the transverse emittance almost linearly with the duration of the noise.

• OSTI ID: 21180362
• Journal Information: Physical Review Letters, Vol. 102, Issue 14; Other Information: DOI: 10.1103/PhysRevLett.102.145003; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ACCELERATORS
BEAM DYNAMICS
BEAM TRANSPORT
ELECTRIC POTENTIAL
ELECTRODES
FOCUSING
NOISE
QUADRUPOLES
RANDOMNESS
TRAPS
WAVE FORMS