Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields

Journal Article · Mon Dec 15 00:00:00 EST 2008 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3040025· OSTI ID:21180046

Weis, Tanja; Engel, Dieter; Ehresmann, Arno ^[1]; Krug, Ingo ^[2]; Hoeink, Volker; Schmalhorst, Jan; Reiss, Guenter ^[3]

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1. Institute of Physics and Centre for Interdisciplinary Nanostructure Science and Technology, University of Kassel, Heinrich-Plett-Str. 40, 34132 Kassel (Germany)
2. DSM IRAMIS SPCSI, CEA-Saclay, 91191 Gif sur Yvette (France)
3. Department of Physics, Thin Films and Nanostructures, Bielefeld University, P.O. Box 100131, 33501 Bielefeld (Germany)

A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.

• OSTI ID: 21180046
• Journal Information: Journal of Applied Physics, Vol. 104, Issue 12; Other Information: DOI: 10.1063/1.3040025; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
36 MATERIALS SCIENCE
APPROXIMATIONS
ATOMIC FORCE MICROSCOPY
CALIBRATION
ION BEAMS
MAGNETIC FIELDS
MAGNETIC PROBES
MAGNETIZATION