Phase transitions and the temperature dependence of the dielectric properties in tetragonally strained barium strontium titanate films

Journal Article · Mon Feb 02 04:00:00 EST 2009 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3079093· OSTI ID:21175944

Alldredge, L M. B.; Chang, Wontae; Kirchoefer, Steven W; Pond, Jeffrey M ^[1]

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1. U.S. Naval Research Laboratory, Washington, DC 20375 (United States)

The dielectric properties of sputter-deposited Ba{sub 1-x}Sr{sub x}TiO{sub 3} (BST) thin films on (001) MgO substrates with in-plane or out-of-plane tetragonal lattice structure distortions were characterized as a function of temperature. A temperature-dependent interpolation calibration technique was developed for increased efficiency of the microwave measurements. The BST films showed significant differences in the ferroelectric phase transition due to lattice distortions with a strong temperature dependence of the in-plane dielectric behavior for films under tensile strain and a weak temperature dependence for films under compressive strain. The experimental data agreed well with theoretical modeling of the BST film strain effect based on Devonshire's theory.

• OSTI ID: 21175944
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 5 Vol. 94; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM COMPOUNDS
CALIBRATION
DEPOSITION
FERROELECTRIC MATERIALS
MAGNESIUM OXIDES
MICROWAVE RADIATION
PERMITTIVITY
PHASE TRANSFORMATIONS
SPUTTERING
STRONTIUM TITANATES
SUBSTRATES
TEMPERATURE DEPENDENCE
TENSILE PROPERTIES
TETRAGONAL LATTICES
THIN FILMS