Laser ablation and ionization mass spectrometric studies of surface impurities with different geometries
Journal Article
·
· AIP Conference Proceedings
- Department of Plasma Physics, KFKI-Research Institute for Particle and Nuclear Physics, H-1525 Budapest 114, P.O. Box 49 (Hungary)
Surface sodium impurity on silicon samples was detected by laser ablation and resonant ionization mass spectrometric methods. Resonant ablation-ionization (RAI) and resonant post-ionization (RPI) arrangements were applied to compare their characteristics. Using the RAI arrangement resonant ionization aided laser plasma ignition process has been observed. Under certain circumstances strong line broadening of the resonance occurred.
- OSTI ID:
- 21153723
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 329; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
Laser mass spectrometric studies of high temperature superconductor ablation
Tokamak deposition probe analysis by laser ionization spectroscopy
Laser Ablation-Aerosol Mass Spectrometry-Chemical Ionization Mass Spectrometry for Ambient Surface Imaging
Conference
·
Sun Dec 31 23:00:00 EST 1989
·
OSTI ID:7008023
Tokamak deposition probe analysis by laser ionization spectroscopy
Journal Article
·
Fri Oct 01 00:00:00 EDT 1993
· Optical Engineering; (United States)
·
OSTI ID:5502934
Laser Ablation-Aerosol Mass Spectrometry-Chemical Ionization Mass Spectrometry for Ambient Surface Imaging
Journal Article
·
Mon Feb 19 23:00:00 EST 2018
· Analytical Chemistry
·
OSTI ID:1427500