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Title: Modification of semiconductor materials with the use of plasma produced by low intensity repetitive laser pulses

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2909154· OSTI ID:21136949
; ; ; ;  [1]; ;  [2]
  1. Institute of Plasma Physics and Laser Microfusion, Association EURATOM-IPPLM, 23 Hery St. 01-497 Warsaw (Poland)
  2. Middle East Technical University, Ankara (Turkey)

This work reports experiments concerning specific application of laser-produced plasma at IPPLM in Warsaw. A repetitive pulse laser system of parameters: energy up to 0.8 J in a 3.5 ns-pulse, wavelength of 1.06 {mu}m, repetition rate of up to 10 Hz, has been employed in these investigations. The characterisation of laser-produced plasma was performed with the use of 'time-of-flight' ion diagnostics simultaneously with other diagnostic methods. The results of laser-matter interaction were obtained in dependence on laser pulse parameters, illumination geometry and target material. The modified SiO{sub 2} layers and sample surface properties were characterised with the use of different methods at the Middle-East Technological University in Ankara and at the Warsaw University of technology. The production of the Ge nanocrystallites has been demonstrated for annealed samples prepared in different experimental conditions.

OSTI ID:
21136949
Journal Information:
AIP Conference Proceedings, Vol. 993, Issue 1; Conference: PLASMA 2007: International conference on research and applications of plasmas; 4. German-Polish conference on plasma diagnostics for fusion and applications; 6. French-Polish seminar on thermal plasma in space and laboratory, Greifswald (Germany), 16-19 Oct 2007; Other Information: DOI: 10.1063/1.2909154; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English