Synthesis, structure and electric studies for La{sub 0.7}A{sub 0.3}Mn{sub 0.96}(In{sub x}Al{sub (1-x)}){sub 0.04}O{sub 3}; A=Ca and Sr perovskites
Journal Article
·
· Journal of Solid State Chemistry
- Physics Department, Faculty of Science, University of Cairo, Gaza (Egypt)
- Reactor and Neutron Physics Department, Nuclear Research Center, Atomic Energy Authority, Cairo (Egypt)
Two polycrystalline series of samples in the form La{sub 0.7}A{sub 0.3}Mn{sub 0.96}(In{sub x}Al{sub (1-x)}){sub 0.04}O{sub 3}; A=Ca and Sr with (0.0{<=}x{<=}1.0) were synthesized using solid-state reaction. Rietveld analysis of the X-ray powder diffraction showed that, the Ca-series has an orthorhombic unit cell (space group Pnma) and the Sr-series is rhombohedral with (space group R3-barC). Structural parameters (refined lattice parameters, atom positions, bond distance, bond angles, valence sum, valence bond, bond lengths and bond angles) are reported and discussed as a function of In content for the two series. Resistivity measurements in zero field are carried out in the range 50-300 K for the Ca-series and in the range 300-400 K for the Sr-series. The obtained transition temperature T{sub {rho}} at which the metal-semiconducting (MS) occurred, is discussed as a function of the compositional parameter x. - Graphical abstract: The reduced resistivity [R(T)/R(T{sub {rho}})] vs. the reduced temperature [T/T{sub {rho}}] of (Al and In) doped La{sub 0.7}Ca{sub 0.3}MnO{sub 3}-manganites. The variation of the amplitude of the giant resistive peak {delta}R(T)/R=[R(T{sub {rho}})-R(T{sub 288}K)]/R(T{sub 288}K) with In content x (inset)
- OSTI ID:
- 21128282
- Journal Information:
- Journal of Solid State Chemistry, Journal Name: Journal of Solid State Chemistry Journal Issue: 5 Vol. 181; ISSN 0022-4596; ISSN JSSCBI
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
BOND ANGLE
BOND LENGTHS
DOPED MATERIALS
LATTICE PARAMETERS
ORTHORHOMBIC LATTICES
PEROVSKITE
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SPACE GROUPS
SYNTHESIS
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TRANSITION TEMPERATURE
TRIGONAL LATTICES
X-RAY DIFFRACTION
BOND ANGLE
BOND LENGTHS
DOPED MATERIALS
LATTICE PARAMETERS
ORTHORHOMBIC LATTICES
PEROVSKITE
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SPACE GROUPS
SYNTHESIS
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TRANSITION TEMPERATURE
TRIGONAL LATTICES
X-RAY DIFFRACTION