Separation modes in microcontacts identified by the rate dependence of the pull-off force

Journal Article · Mon Aug 04 00:00:00 EDT 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2967855· OSTI ID:21124062

Chen, L ^[1]; McGruer, N E; Adams, G G ^[2]; Du, Y ^[3]

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1. RF Micro Devices, Inc., Charlotte, North Carolina 28269 (United States)
2. Northeastern University, Boston, Massachusetts 02115 (United States)
3. Qualcomm Corporation, San Jose, California 95134 (United States)

We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.

• OSTI ID: 21124062
• Journal Information: Applied Physics Letters, Vol. 93, Issue 5; Other Information: DOI: 10.1063/1.2967855; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BRITTLENESS
DUCTILITY
ELECTRIC CONTACTS
MICROSTRUCTURE
SCANNING ELECTRON MICROSCOPY