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Title: Conducting transition metal nitride thin films with tailored cell sizes: The case of {delta}-Ti{sub x}Ta{sub 1-x}N

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2955838· OSTI ID:21123983
 [1];  [2]; ; ; ;  [1];  [3]
  1. Department of Materials Science and Engineering, University of Ioannina, GR-45110 Ioannina (Greece)
  2. Laboratoire PHYMAT, Universite de Poitiers-CNRS, UMR 6630, SP2MI, Teleport 2, Bd Marie et Pierre Curie, 86962 Chasseneuil-Futuroscope (France)
  3. Department of Physics, University of Ioannina, GR-45110 Ioannina (Greece)

We present results on the stability and tailoring of the cell size of conducting {delta}-Ti{sub x}Ta{sub 1-x}N obtained by film growth and ab initio calculations. Despite the limited solubility of Ta in Ti, we show that TiN and TaN are soluble due to the hybrization of the d and sp electrons of the metal and N, respectively, that stabilizes the ternary system to the rocksalt structure. The stress-free cell sizes follow the Vegard's rule; nevertheless, process-dependent stresses expand the cell size of the as-grown films. The electronic properties of {delta}-Ti{sub x}Ta{sub 1-x}N films ({rho}=180 {omega} cm) are similar to those of TiN and TaN.

OSTI ID:
21123983
Journal Information:
Applied Physics Letters, Vol. 93, Issue 1; Other Information: DOI: 10.1063/1.2955838; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English

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