Radiating Shock Measurements in the Z-Pinch Dynamic Hohlraum

Journal Article · Fri Mar 28 00:00:00 EDT 2008 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.100.125004· OSTI ID:21123792

Rochau, G A; Bailey, J E; Chandler, G A; Lemke, R W; Peterson, K J; Slutz, S A ^[1]; Maron, Y; Fisher, D V; Fisher, V I; Stambulchik, E ^[2]; Dunham, G S ^[3]; MacFarlane, J J ^[4]; Schroen, D G ^[5]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
2. Weizmann Institute, Rehovot (Israel)
3. K-tech Corporation, Albuquerque, New Mexico 87185 (United States)
4. Prism Computational Sciences, Madison, Wisconsin 53704 (United States)
5. General Atomics, San Diego, California 92186 (United States)

The Z-pinch dynamic hohlraum is an x-ray source for high energy-density physics studies that is heated by a radiating shock to radiation temperatures >200 eV. The time-dependent 300-400 eV electron temperature and 15-35 mg/cc density of this shock have been measured for the first time using space-resolved Si tracer spectroscopy. The shock x-ray emission is inferred from these measurements to exceed 50 TW, delivering >180 kJ to the hohlraum.

• OSTI ID: 21123792
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 12 Vol. 100; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ELECTRON TEMPERATURE
ENERGY DENSITY
EV RANGE 100-1000
PHOTON EMISSION
SPECTROSCOPY
TIME DEPENDENCE
X-RAY SOURCES