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Title: Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS

Abstract

The coefficient of linear thermal expansion of single-crystal SmS has been measured in the temperature range 300-850 K by dilatometry and X-ray diffraction. It is shown that the difference in the results obtained by these two methods is due to the heating-induced formation of SmS phases with small lattice parameters (5.62-5.8 A) close to that for the metallic SmS phase.

Authors:
 [1]; ;  [2]; ; ; ;  [3]
  1. Russian Academy of Sciences, Ioffe Physicotechnical Institute (Russian Federation), E-mail: Vladimir.Kaminski@mail.ioffe.ru
  2. Russian Academy of Sciences, Institute of Physics, Dagestan Scientific Center (Russian Federation)
  3. Russian Academy of Sciences, Ioffe Physicotechnical Institute (Russian Federation)
Publication Date:
OSTI Identifier:
21088469
Resource Type:
Journal Article
Resource Relation:
Journal Name: Semiconductors; Journal Volume: 41; Journal Issue: 1; Other Information: DOI: 10.1134/S1063782607010010; Copyright (c) 2007 Nauka/Interperiodica; Article Copyright (c) 2007 Pleiades Publishing, Ltd; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DILATOMETRY; HEATING; LATTICE PARAMETERS; MONOCRYSTALS; SAMARIUM SULFIDES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THERMAL EXPANSION; X-RAY DIFFRACTION

Citation Formats

Kaminskii, V. V., Luguev, S. M., Omarov, Z. M., Sharenkova, N. V., Golubkov, A. V., Vasil'ev, L. N., and Solov'ev, S. M. Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS. United States: N. p., 2007. Web. doi:10.1134/S1063782607010010.
Kaminskii, V. V., Luguev, S. M., Omarov, Z. M., Sharenkova, N. V., Golubkov, A. V., Vasil'ev, L. N., & Solov'ev, S. M. Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS. United States. doi:10.1134/S1063782607010010.
Kaminskii, V. V., Luguev, S. M., Omarov, Z. M., Sharenkova, N. V., Golubkov, A. V., Vasil'ev, L. N., and Solov'ev, S. M. Mon . "Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS". United States. doi:10.1134/S1063782607010010.
@article{osti_21088469,
title = {Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS},
author = {Kaminskii, V. V. and Luguev, S. M. and Omarov, Z. M. and Sharenkova, N. V. and Golubkov, A. V. and Vasil'ev, L. N. and Solov'ev, S. M.},
abstractNote = {The coefficient of linear thermal expansion of single-crystal SmS has been measured in the temperature range 300-850 K by dilatometry and X-ray diffraction. It is shown that the difference in the results obtained by these two methods is due to the heating-induced formation of SmS phases with small lattice parameters (5.62-5.8 A) close to that for the metallic SmS phase.},
doi = {10.1134/S1063782607010010},
journal = {Semiconductors},
number = 1,
volume = 41,
place = {United States},
year = {Mon Jan 15 00:00:00 EST 2007},
month = {Mon Jan 15 00:00:00 EST 2007}
}