Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS

Journal Article · Mon Jan 15 00:00:00 EST 2007 · Semiconductors

DOI:https://doi.org/10.1134/S1063782607010010· OSTI ID:21088469

Luguev, S M; Omarov, Z M ^[1]; Sharenkova, N V; Golubkov, A V; Vasil'ev, L N; Solov'ev, S M ^[2]

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1. Russian Academy of Sciences, Institute of Physics, Dagestan Scientific Center (Russian Federation)
2. Russian Academy of Sciences, Ioffe Physicotechnical Institute (Russian Federation)

The coefficient of linear thermal expansion of single-crystal SmS has been measured in the temperature range 300-850 K by dilatometry and X-ray diffraction. It is shown that the difference in the results obtained by these two methods is due to the heating-induced formation of SmS phases with small lattice parameters (5.62-5.8 A) close to that for the metallic SmS phase.

• OSTI ID: 21088469
• Journal Information: Semiconductors, Vol. 41, Issue 1; Other Information: DOI: 10.1134/S1063782607010010; Copyright (c) 2007 Nauka/Interperiodica; Article Copyright (c) 2007 Pleiades Publishing, Ltd; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DILATOMETRY
HEATING
LATTICE PARAMETERS
MONOCRYSTALS
SAMARIUM SULFIDES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
THERMAL EXPANSION
X-RAY DIFFRACTION