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Title: Effects of charged Higgs bosons in the {nu}{tau}N deep inelastic scattering within the 2HDM(II) and the UHE {nu}{tau} detection

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2751985· OSTI ID:21064128
;  [1];  [2]
  1. Instituto de Fisica, BUAP. Apdo. Postal J-48, C.P. 72570 Puebla, Pue. (Mexico)
  2. Fac. de Cs. Fisico-Matematicas, BUAP. Apdo. Postal 1364, C.P. 72000 Puebla, Pue. (Mexico)

We study the deep inelastic process {nu}{tau} + N {yields} {tau}- + X (with N {identical_to} (n + p)/2 an isoscalar nucleon), in the context of the two Higgs doublet model type II (2HDM(II)). We discuss the contribution to the total cross section of diagrams, in which a charged Higgs boson is exchanged. The results show the strong dependence of such contribution on tan {beta} and MH{+-}. In the region 50 {<=} tan {beta} {<=} 200 and 90 GeV {<=} MH{+-} {<=} 600 GeV with the additional experimental constraint on the involved model parameters MH{+-} {>=} 1.5 x tan {beta} GeV, the contribution of the charged Higgs boson exchange diagrams to the cross section of the charged current inclusive {nu}{tau}N collision can become important. The contribution for an inclusive dispersion generated through the collision of an ultrahigh energy tau-neutrino with E{nu} {approx_equal} 1020 eV on a target nucleon can be larger than the value of the contribution of the W{+-} exchange diagrams, provided that MH{+-} {approx_equal} 300 GeV and tan {beta} {approx_equal} 200. Such enhancement and the induced variation on the mean inelasticity <y>CC could lead to sizeable effects in the acceptance of cosmic tau-neutrino detectors.

OSTI ID:
21064128
Journal Information:
AIP Conference Proceedings, Vol. 917, Issue 1; Conference: 6. Latin American symposium on high energy physics; 12. Mexican school of particles and fields, Puerto Vallarta (Mexico), 1-8 Nov 2006; Other Information: DOI: 10.1063/1.2751985; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English