The solution growth route and characterization of electrochromic tungsten oxide thin films

Journal Article · Tue Dec 04 04:00:00 EST 2007 · Materials Research Bulletin

DOI:https://doi.org/10.1016/j.materresbull.2007.02.004· OSTI ID:21062258

Todorovski, Toni ^[1]; Najdoski, Metodija ^[1]

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1. Institute of Chemistry, Faculty of Natural Sciences and Mathematics, Sts. Cyril and Methodius University, PO Box 162, Arhimedova 5, 1000 Skopje (Macedonia, The Former Yugoslav Republic of)

Electrochromic tungsten oxide thin films were prepared by using an aqueous solution of Na{sub 2}WO{sub 4}.2H{sub 2}O and dimethyl sulfate. Various techniques were used for the characterization of the films such as X-ray diffraction, cyclic voltammetry, SEM analysis and VIS-spectroscopy. The thin film durability was tested in an aqueous solution of LiClO{sub 4} (0.1 mol/dm{sup 3}) for about 7000 cycles followed by cyclic voltammetry. No significant changes in the cyclic voltammograms were found, thus proving the high durability of the films. The optical transmittance spectra of coloured and bleached states showed significant change in the transmittance, which makes these films favorable for electrochromic devices.

• OSTI ID: 21062258
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 12 Vol. 42; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AQUEOUS SOLUTIONS
CRYSTAL GROWTH
CRYSTAL STRUCTURE
ELECTROCHROMISM
LITHIUM PERCHLORATES
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SPECTRA
THIN FILMS
TUNGSTEN OXIDES
VOLTAMETRY
X-RAY DIFFRACTION