Magnified NDI Imaging Using MIRRORCLE-Type Table-Top Synchrotron

Journal Article · Fri Mar 30 00:00:00 EDT 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2723634· OSTI ID:21056934

Hirai, T; Sasaki, M; Nihira, T ^[1]; Yamada, H ^[1]; Morita, M; Hasegawa, D ^[2]

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1. Faculty of science and Engineering, Ritsumeikan University, Kusatsu, Shiga, 525-8577 (Japan)
2. Photon Production Laboratory Ltd, Omihachiman, Shiga, 523-0898 (Japan)

We report that the magnified imaging using the portable synchrotron named MIRRORCLE has unique advantages for non-destructive inspection (NDI) of some products. This machine is a high energy x-ray source which can have a micron-sized point source, which is different from the conventional synchrotron, linear accelerator and the x-ray tube. The images produced with micron-sized point source and wide spectrum can display in detail the industrial products containing several materials in detail. The obtained x-ray images characterization is expected to provide a new tool for NDI of industrial products.

• OSTI ID: 21056934
• Journal Information: AIP Conference Proceedings, Vol. 902, Issue 1; Conference: 2. international symposium on portable synchrotron light sources and advanced applications, Shiga (Japan), 15-17 Jan 2007; Other Information: DOI: 10.1063/1.2723634; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
IMAGES
POINT SOURCES
PORTABLE SOURCES
SYNCHROTRON RADIATION
SYNCHROTRONS
X RADIATION
X-RAY RADIOGRAPHY