An XAFS Beamline at the SAGA Light Source

Journal Article · Fri Feb 02 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2644694· OSTI ID:21054770

Okajima, Toshihiro ^[1]; Hara, Kazuhiro ^[2]; Tabata, Masaaki ^[3]; Setoyama, Hiroyuki; Yoshimura, Daisuke ^[1]; Chikaura, Yoshinori ^[4]

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1. Kyushu Synchrotron Light Research Center, 8-7 Yayoigaoka, Tosu, Saga 841-0005 (Japan)
2. Graduate school of Engineering, Kyushu University, 6-10-1 Hakozaki, Higasi-ku, Fukuoka 812-8581 (Japan)
3. Faculty of Science and Engineering, Saga University, Honjyo, Saga 840-8502 (Japan)
4. Graduate school of Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka 804-8550 (Japan)

A new hard X-ray beamline, BL15, has been designed and constructed at the SAGA-Light Source. The beamline is optimized for industrial applications of the synchrotron light. X-rays with photon energies from 2.1 keV to 14.2 keV are delivered to the experimental station passing a fixed-exit double-crystal Si(111) monochromator and a bent cylindrical mirror. Basic experimental equipments for XAFS measurement, high resolution diffractometry, various kinds of X-ray imaging and energy-dispersive diffractometry have been prepared for the station. From our initial commissioning and performance testing of the beamline, we show that BL15 can perform XAFS measurements.

• OSTI ID: 21054770
• Journal Information: AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644694; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
BEAM PRODUCTION
COMMISSIONING
CRYSTALS
CYLINDRICAL CONFIGURATION
FINE STRUCTURE
HARD X RADIATION
KEV RANGE
LIGHT SOURCES
MONOCHROMATORS
PERFORMANCE TESTING
PHOTON BEAMS
PHOTONS
RESOLUTION
SILICON
SYNCHROTRON RADIATION
X-RAY SPECTRA
X-RAY SPECTROSCOPY