Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering

Journal Article · Fri Feb 02 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2644678· OSTI ID:21054756

Hayashi, Hisashi ^[1]

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1. Department of Chemical and Biological Sciences, Faculty of Science, Japan Women's University, 2-8-1, Mejirodai, Bunkyo-ku, Tokyo 112-8681 (Japan)

Lifetime-broadening-suppressed (LBS), state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) spectra in terms of a formula derived from the Kramers-Heisenberg equation. By a combination of a third-generation synchrotron source and a spectrometer equipped with large acceptance as well as high-resolution crystals, high quality RIXS data to warrant to extract LBS-XAFS can be collected. LBS-XAFS spectra of CuO nano-particles on ZnO with various Cu concentrations up to as low as 1 mol % are presented and concentration dependence is discussed.

• OSTI ID: 21054756
• Journal Information: AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644678; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTRA
ABSORPTION SPECTROSCOPY
COPPER OXIDES
CRYSTAL STRUCTURE
CRYSTALS
FINE STRUCTURE
INELASTIC SCATTERING
NANOSTRUCTURES
PARTICLES
RESOLUTION
RESONANCE SCATTERING
X-RAY DIFFRACTION
X-RAY SPECTRA
X-RAY SPECTROSCOPY
ZINC OXIDES