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Title: Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering

Abstract

Lifetime-broadening-suppressed (LBS), state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) spectra in terms of a formula derived from the Kramers-Heisenberg equation. By a combination of a third-generation synchrotron source and a spectrometer equipped with large acceptance as well as high-resolution crystals, high quality RIXS data to warrant to extract LBS-XAFS can be collected. LBS-XAFS spectra of CuO nano-particles on ZnO with various Cu concentrations up to as low as 1 mol % are presented and concentration dependence is discussed.

Authors:
 [1];  [2]
  1. Department of Chemical and Biological Sciences, Faculty of Science, Japan Women's University, 2-8-1, Mejirodai, Bunkyo-ku, Tokyo 112-8681 (Japan)
  2. (Japan)
Publication Date:
OSTI Identifier:
21054756
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 882; Journal Issue: 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644678; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; COPPER OXIDES; CRYSTAL STRUCTURE; CRYSTALS; FINE STRUCTURE; INELASTIC SCATTERING; NANOSTRUCTURES; PARTICLES; RESOLUTION; RESONANCE SCATTERING; X-RAY DIFFRACTION; X-RAY SPECTRA; X-RAY SPECTROSCOPY; ZINC OXIDES

Citation Formats

Hayashi, Hisashi, and PRESTO, JST, 4-1-8 Honcho Kawaguchi, Saitama, 332-0012. Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering. United States: N. p., 2007. Web. doi:10.1063/1.2644678.
Hayashi, Hisashi, & PRESTO, JST, 4-1-8 Honcho Kawaguchi, Saitama, 332-0012. Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering. United States. doi:10.1063/1.2644678.
Hayashi, Hisashi, and PRESTO, JST, 4-1-8 Honcho Kawaguchi, Saitama, 332-0012. Fri . "Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering". United States. doi:10.1063/1.2644678.
@article{osti_21054756,
title = {Selective XAFS Studies of Functional Materials by Resonant Inelastic X-Ray Scattering},
author = {Hayashi, Hisashi and PRESTO, JST, 4-1-8 Honcho Kawaguchi, Saitama, 332-0012},
abstractNote = {Lifetime-broadening-suppressed (LBS), state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) spectra in terms of a formula derived from the Kramers-Heisenberg equation. By a combination of a third-generation synchrotron source and a spectrometer equipped with large acceptance as well as high-resolution crystals, high quality RIXS data to warrant to extract LBS-XAFS can be collected. LBS-XAFS spectra of CuO nano-particles on ZnO with various Cu concentrations up to as low as 1 mol % are presented and concentration dependence is discussed.},
doi = {10.1063/1.2644678},
journal = {AIP Conference Proceedings},
number = 1,
volume = 882,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2007},
month = {Fri Feb 02 00:00:00 EST 2007}
}