Developing a Sagittally Focusing Double-Multilayer Monochromator
Journal Article
·
· AIP Conference Proceedings
- X-Ray Science Division, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 (United States)
We report the development of a sagittally focusing double multilayer monochromator to produce a spatially extended, wide-bandpass x-ray beam from intense synchrotron bending-magnet source at the Advanced Photon Source for ultrafast x-radiography and -tomography applications. This monochromator consists of the two W/B4C multilayers with a 25-Aa periodicity coated on Si single-crystal substrates. The second crystal is mounted on a saggitally focusing bender which can; dynamically change the bending radius of the crystal in order to focus the beam to various points along the beamline. With this new apparatus, it becomes possible to adjust the x-ray beam size to best match the area detector size and the object size to facilitate a more efficient data collection using ultrafast x-radiography and -tomography.
- OSTI ID:
- 21052676
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 879; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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