Evaluation of Defects inside Beryllium Foils using X-ray Computed Tomography and Shearing Interferometry
Journal Article
·
· AIP Conference Proceedings
- University of Hyogo, Kouto 3-2-1, Kamigori-cho, Ako-gun, Hyogo, 678-1297 (Japan)
- Harima Institute, RIKEN, Kouto 1-1-1, Sayo-cho, Sayo-gun, Hyogo, 679-5148 (Japan)
- Japan Synchrotron Radiation Research Institute (JASRI), Kouto 1-1-1, Sayo-cho, Sayo-gun, Hyogo, 679-5198 (Japan)
When beryllium is used in transmission X-ray optical elements for spatially coherent beams, speckles are usually observed in the transmission images. These speckles seem to be caused by defects either inside or on the surface of beryllium foil. We measured highly polished beryllium foil using two methods, X-ray computed tomography and X-ray shearing interferometry. The results indicate that observed speckle pattern is caused by many voids inside beryllium or inner low-density regions.
- OSTI ID:
- 21049285
- Journal Information:
- AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436322; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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