Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Wide-Band KB Optics for Spectro-Microscopy Imaging Applications in the 6-13 keV X-ray Energy Range

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2436314· OSTI ID:21049276
; ; ;  [1];  [2]
  1. European Synchrotron Radiation Facility, BP 220, 38043, Grenoble cedex (France)
  2. Istituto di Fotonica e Nanotecnologie, Centro CNR-ITC di Fisica degli Stati Aggregati, 38050 Povo (Italy)
We present a Kirkpatrick-Baez optics (KB) system specially optimized to operate in the 6-13 keV X-ray range, where valuable characteristic lines are present. The mirrors are coated with aperiodic laterally graded (Ru/B4C)35 multilayers to define a 15% energy bandpass and to gain flux as compared to total reflection mirrors. For any X-ray energy selected the shape of each mirror can be optimized with a dynamical bending system so as to concentrate the X-ray beam into a micrometer-size spot. Once the KB mirrors are aligned at the X-ray energy corresponding to the barycenter of the XAS spectrum to be performed they remain in a steady state during the micro-XAS scans to minimize beam displacements. Results regarding the performance of the wideband KB optics and of the spectro-microscopy setup are presented, including beam stability issues.
OSTI ID:
21049276
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 879; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English