Adaptation of a Commercial Optical CMOS Image Sensor for Direct-Detection Fast X-ray Imaging
- Department of Physics, Northern Illinois University, DeKalb, Illinois 60115 (United States)
- Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
We have adapted a commercial CMOS optical image sensor for use as a fast x-ray detector. The sensor was used in a mode where the x-rays impinge directly on the sensor. Area detectors can significantly improve the signal-to-noise ratio of acquired data in the low photon count rate situations (even at 3rd generation synchrotron sources) encountered in both small angle x-ray scattering (SAXS) and x-ray photon correlation spectroscopy (XPCS) experiments,. CCD area detectors have been used for these types of experiments, but the relatively slow readout times typical of CCDs limit their use for studying the dynamics and kinetics of many samples. We characterized the performance of a CMOS optical detector for use in XPCS experiments.
- OSTI ID:
- 21049231
- Journal Information:
- AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436273; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
CHARGE-COUPLED DEVICES
CORRELATIONS
COUNTING RATES
IMAGES
PERFORMANCE
PHOTONS
RADIATION DETECTORS
READOUT SYSTEMS
SENSORS
SIGNAL-TO-NOISE RATIO
SMALL ANGLE SCATTERING
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
X RADIATION
X-RAY DETECTION
X-RAY DIFFRACTION