Microradiography with Semiconductor Pixel Detectors

Journal Article · Mon Nov 26 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2825764· OSTI ID:21039377

Jakubek, Jan; Cejnarova, Andrea; Dammer, Jiri; Holy, Tomas; Platkevic, Michal; Pospisil, Stanislav; Vavrik, Daniel; Vykydal, Zdenek ^[1]

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1. Institute of Experimental and Applied Physics, Czech Technical University in Prague, Horska 3a/22, CZ 12800 Prague 2 (Czech Republic)

High resolution radiography (with X-rays, neutrons, heavy charged particles, ...) often exploited also in tomographic mode to provide 3D images stands as a powerful imaging technique for instant and nondestructive visualization of fine internal structure of objects. Novel types of semiconductor single particle counting pixel detectors offer many advantages for radiation imaging: high detection efficiency, energy discrimination or direct energy measurement, noiseless digital integration (counting), high frame rate and virtually unlimited dynamic range. This article shows the application and potential of pixel detectors (such as Medipix2 or TimePix) in different fields of radiation imaging.

• OSTI ID: 21039377
• Journal Information: AIP Conference Proceedings, Vol. 958, Issue 1; Conference: 4. International summer school on nuclear physics methods and accelerators in biology and medicine, Prague (Czech Republic), 8-19 Jul 2007; Other Information: DOI: 10.1063/1.2825764; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
COMPUTERIZED TOMOGRAPHY
EFFICIENCY
IMAGES
MICRORADIOGRAPHY
NEUTRONS
RADIATION DETECTION
RESOLUTION
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR MATERIALS
X RADIATION