Atomic data and spectral line intensities for Ar XV

Journal Article · Sat Mar 15 00:00:00 EDT 2008 · Atomic Data and Nuclear Data Tables

DOI:https://doi.org/10.1016/j.adt.2007.11.001· OSTI ID:21028254

Bhatia, A K ^[1]; Landi, E ^[2]

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1. NASA/Goddard Space Flight Center, Greenbelt, MD 20771 (United States)
2. ARTEP, Inc., Columbia, MD 21044 (United States)

Electron impact collision strengths, energy levels, oscillator strengths, and spontaneous radiative decay rates are calculated for Ar XV. The configurations used are 2s{sup 2}, 2s2p, 2p{sup 2}, 2l3l{sup '}, 2l4l{sup '}and2s5l{sup '}, with l=s,pandl{sup '}=s,p,d giving rise to 92 fine-structure levels in intermediate coupling. Collision strengths are calculated at eight incident energies (10, 20, 30, 60, 120, 180, 240, and 300 Ry) for transitions within the three lowest configurations, and five incident energies (60, 120, 180, 240, and 300 Ry) for transitions between the lowest five levels and the n = 3, 4, 5 configurations, using the distorted wave approximation. Excitation rate coefficients are calculated as a function of electron temperature by assuming a Maxwellian electron velocity distribution. Using the excitation rate coefficients and the radiative transition rates of the present work, and R-matrix results for the 2s{sup 2}, 2s2p, 2p{sup 2} configurations available in the literature, statistical equilibrium equations for level populations are solved at electron densities covering the range of 10{sup 8}-10{sup 14} cm{sup -3} at an electron temperature of logT{sub e}(K)=6.6, corresponding to the maximum abundance of Ar XV. Spectral line intensities are calculated, and their diagnostic relevance is discussed. Observed line ratios indicate electron temperatures of the relevant emitting plasma close to logT{sub e}(K)=6.6. This dataset will be made available in the next version of the CHIANTI database.

• OSTI ID: 21028254
• Journal Information: Atomic Data and Nuclear Data Tables, Vol. 94, Issue 2; Other Information: DOI: 10.1016/j.adt.2007.11.001; PII: S0092-640X(07)00069-1; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0092-640X
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ABUNDANCE
APPROXIMATIONS
ARGON
DISTORTED WAVE THEORY
ELECTRON BEAMS
ELECTRON DENSITY
ELECTRON TEMPERATURE
ELECTRON-ATOM COLLISIONS
ENERGY LEVELS
EQUATIONS
EVALUATED DATA
EXCITATION
EXPERIMENTAL DATA
FINE STRUCTURE
INTERMEDIATE COUPLING
NUCLEAR DATA COLLECTIONS
OSCILLATOR STRENGTHS
PLASMA
R MATRIX
RADIATIVE DECAY