Evidence for an Elongated (>60 Ion Skin Depths) Electron Diffusion Region during Fast Magnetic Reconnection
Journal Article
·
· Physical Review Letters
- Space Sciences Laboratory, University of California, Berkeley, California 94720 (United States)
- Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716 (United States)
Observations of an extremely elongated electron diffusion region occurring during fast reconnection are presented. Cluster spacecraft in situ observations of an expanding reconnection exhaust reveal a broad current layer ({approx}10 ion skin depths thick) supporting the reversal of the reconnecting magnetic field together with an intense current embedded at the center that is due to a super-Alfvenic electron outflow jet with transverse scale of {approx}9 electron skin depths. The electron jet extends at least 60 ion skin depths downstream from the X-line.
- OSTI ID:
- 21024618
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 25 Vol. 99; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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