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Benchmarking of Electro-Optic Monitors for Femtosecond Electron Bunches

Journal Article · · Physical Review Letters
; ;  [1];  [2]; ; ; ; ;  [3];  [4]
  1. University of Dundee, Dundee DD1 4HN (United Kingdom)
  2. Accelerator Science and Technology Center, STFC Daresbury Laboratory, Warrington, Cheshire WA4 4AD (United Kingdom)
  3. Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22603 Hamburg (Germany)
  4. School of Computing and Creative Technologies, University of Abertay Dundee, Bell Street, Dundee DD1 1HG (United Kingdom)
The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
OSTI ID:
21024327
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 16 Vol. 99; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English