Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV
Journal Article
·
· Review of Scientific Instruments
- Department of Physics, University of Fribourg, CH-1700 Fribourg (Switzerland)
High-resolution x-ray measurements were performed with a von Hamos-type bent crystal spectrometer using for the detection of the diffracted photons either a back-illuminated charge-coupled device (CCD) camera or a front-illuminated one. For each CCD the main x-ray emission lines (e.g., K{alpha}, K{beta}, L{alpha}, and L{beta}) of a variety of elements were measured in order to probe the performances of the two detectors between 1 and 18 keV. From the observed x-ray lines the linearity of the energy response, the noise level, the energy resolution, and the quantum efficiency ratio of the two CCDs were determined.
- OSTI ID:
- 21024277
- Journal Information:
- Review of Scientific Instruments, Vol. 78, Issue 9; Other Information: DOI: 10.1063/1.2779214; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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