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Title: Structural Basis for the Conducting Interface between LaAlO{sub 3} and SrTiO{sub 3}

Journal Article · · Physical Review Letters
; ; ; ; ; ;  [1]; ; ;  [2];  [3]
  1. Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
  2. Randall Laboratory of Physics and FOCUS Center, University of Michigan, Ann Arbor, Michigan 48109-1120 (United States)
  3. Racah Institute of Physics, Hebrew University, Jerusalem, 91904 (Israel)

The complete atomic structure of a five-monolayer film of LaAlO{sub 3} on SrTiO{sub 3} has been determined for the first time by surface x-ray diffraction in conjunction with the coherent Bragg rod analysis phase-retrieval method and further structural refinement. Cationic mixing at the interface results in dilatory distortions and the formation of metallic La{sub 1-x}Sr{sub x}TiO{sub 3}. By invoking electrostatic potential minimization, the ratio of Ti{sup 4+}/Ti{sup 3+} across the interface was determined, from which the lattice dilation could be quantitatively explained using ionic radii considerations. The correctness of this model is supported by density functional theory calculations. Thus, the formation of a quasi-two-dimensional electron gas in this system is explained, based on structural considerations.

OSTI ID:
21024268
Journal Information:
Physical Review Letters, Vol. 99, Issue 15; Other Information: DOI: 10.1103/PhysRevLett.99.155502; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
Country of Publication:
United States
Language:
English