Characterization of Ce-Pd(111) and Ce-Pd(110) surface alloys
Journal Article
·
· Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films
- Physics Department, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim (Norway)
Cerium-palladium surface alloys have been studied by x-ray and ultraviolet photoelectron spectroscopy (XPS), low energy electron diffraction (LEED), and photoemission electron microscopy. Desorption of CO has been studied by temperature programed desorption spectroscopy. Thin layers of Ce were deposited on Pd(111) and Pd(110) single crystal substrates to form surface alloys upon annealing to 1000 K. An enrichment of Pd at the surface is observed and the work functions of the surface alloys are found to be 0.2-0.6 eV less than the value for the bare Pd substrate, which are substantially larger than the values for the as-deposited Ce-Pd samples. Several different LEED patterns were observed depending on the annealing temperature. The estimated Ce valence from XPS was found to be in the range from 3.16 to 3.22 for the surface alloys after annealing.
- OSTI ID:
- 21020877
- Journal Information:
- Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Journal Name: Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films Journal Issue: 5 Vol. 25; ISSN 1553-1813
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ANNEALING
CARBON MONOXIDE
CERIUM ALLOYS
DESORPTION
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
EV RANGE 01-10
MONOCRYSTALS
PALLADIUM 110
PALLADIUM 111
PALLADIUM ALLOYS
PHOTOEMISSION
SUBSTRATES
SURFACES
THIN FILMS
ULTRAVIOLET RADIATION
WORK FUNCTIONS
X RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY
ANNEALING
CARBON MONOXIDE
CERIUM ALLOYS
DESORPTION
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
EV RANGE 01-10
MONOCRYSTALS
PALLADIUM 110
PALLADIUM 111
PALLADIUM ALLOYS
PHOTOEMISSION
SUBSTRATES
SURFACES
THIN FILMS
ULTRAVIOLET RADIATION
WORK FUNCTIONS
X RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY