Investigation of the structural transformation behavior of Ge{sub 2}Sb{sub 2}Te{sub 5} thin films using high resolution electron microscopy

Journal Article · Mon Sep 03 00:00:00 EDT 2007 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2783478· OSTI ID:21016133

Kim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae ^[1]

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1. Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701 (Korea, Republic of)

Structural transformation of the Ge{sub 2}Sb{sub 2}Te{sub 5} was investigated by a high resolution transmission electron microscopy (HRTEM). It was found that Ge atoms undergo umbrella-flip motion from a tetrahedral site into an octahedral site in transforming from the amorphous to the metastable phase of Ge{sub 2}Sb{sub 2}Te{sub 5}. The presence of a twin boundary between fcc and hexagonal structured Ge{sub 2}Sb{sub 2}Te{sub 5} was also confirmed through the HRTEM observations. These results support the umbrella-flip model proposed by Kolobov et al. [Nat. Mater. 3, 703 (2004)] and the epitaxial growth model proposed by Park et al. [Appl. Surf. Sci. 256, 8102 (2006)].

• OSTI ID: 21016133
• Journal Information: Applied Physics Letters, Vol. 91, Issue 10; Other Information: DOI: 10.1063/1.2783478; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AMORPHOUS STATE
ANTIMONY ALLOYS
EPITAXY
FCC LATTICES
GERMANIUM ALLOYS
PHASE TRANSFORMATIONS
TELLURIUM ALLOYS
TERNARY ALLOY SYSTEMS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY