Electromagnetically induced transparency line shapes for large probe fields and optically thick media
Journal Article
·
· Physical Review. A
- Department of Physics, University of Rochester, Rochester, New York 14627 (United States)
We calculate the line shape and linewidths for electromagnetically induced transparency (EIT) in optically thick, Doppler broadened media (buffer gasses are also considered). In generalizing the definition of the EIT linewidth to optically thick media, we find two different linewidth definitions apply depending on whether the experiment is pulsed or continuous wave (cw). Using the cw definition for the EIT line shape we derive analytic expressions describing the linewidth as a function of optical depth. We also review the EIT line shapes in optically thin media and provide physical arguments for how the line shapes change as a function of various parameters.
- OSTI ID:
- 21011297
- Journal Information:
- Physical Review. A, Journal Name: Physical Review. A Journal Issue: 1 Vol. 76; ISSN 1050-2947; ISSN PLRAAN
- Country of Publication:
- United States
- Language:
- English
Similar Records
Slow-light dynamics from electromagnetically-induced-transparency spectra
Transients of the electromagnetically-induced-transparency-enhanced refractive Kerr nonlinearity: Theory
Electromagnetically induced transparency: the thickness of the vapor column is of the order of a light wavelength
Journal Article
·
Fri May 15 00:00:00 EDT 2009
· Physical Review. A
·
OSTI ID:21313109
Transients of the electromagnetically-induced-transparency-enhanced refractive Kerr nonlinearity: Theory
Journal Article
·
Sat Jul 15 00:00:00 EDT 2006
· Physical Review. A
·
OSTI ID:20852975
Electromagnetically induced transparency: the thickness of the vapor column is of the order of a light wavelength
Journal Article
·
Wed Aug 15 00:00:00 EDT 2007
· Journal of the Optical Society of America. Part B, Optical Physics
·
OSTI ID:20929768