Preparation of KMgF{sub 3} and Eu-doped KMgF{sub 3} nanocrystals in water-in-oil microemulsions

Journal Article · Thu Feb 15 04:00:00 EST 2007 · Materials Research Bulletin

OSTI ID:21000587

Ruinian, Hua ^[1]; Zhihong, Jia ^[2]; Chunshan, Shi ^[3]

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1. College of Life Science, Dalian Nationalities University, Dalian 116600 (China)
2. Department of Geosciences, Material Sciences Center, Philipps University, Hans-Meerwein-Strasse, D-35032 Marburg (Germany)
3. Key Laboratory of Rare Earth Chemistry and Physics, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022 (China)

In this study, KMgF{sub 3}:Eu{sup 2+} luminescent nanocrystals (NCs) were prepared in water/cetyltrimethylammonium bromide (CTAB)/2-octanol microemulsions. The KMgF{sub 3}:Eu{sup 2+} NCs were characterized by transmission electron microscopy (TEM), X-ray diffractometer (XRD), fluorescence spectrum, infrared spectroscopy (IR) and elementary analysis. The results showed that the size of the KMgF{sub 3}:Eu{sup 2+} NCs was hardly affected by water content and surfactant (CTAB) concentration. The emission spectrum showed that the position of the 362 nm peak is due to the K{sup +} sites substituted Eu{sup 2+}. Two emission peaks located at 589 and 612 nm can be attributed to Eu{sup 3+}, which exist at two different types of Eu{sup 3+} centers: one is Eu{sup 3+} at a K{sup +} site, the other is clustering of Eu{sup 3+} ions in the interstices of KMgF{sub 3} host lattice.

• OSTI ID: 21000587
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 2 Vol. 42; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
BROMIDES
CHEMICAL PREPARATION
DOPED MATERIALS
EMISSION SPECTRA
EUROPIUM IONS
FLUORESCENCE SPECTROSCOPY
INFRARED SPECTRA
LUMINESCENCE
MAGNESIUM FLUORIDES
MICROEMULSIONS
NANOSTRUCTURES
POTASSIUM FLUORIDES
POTASSIUM IONS
SURFACTANTS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS