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Title: Advanced Neutronics Tools for BWR Design Calculations

Conference ·
OSTI ID:20995455
; ; ; ;  [1];  [2];  [3];  [4]
  1. CEA-Cadarache, 13108 St Paul lez Durance Cedex (France)
  2. AREVA NP SAS (France)
  3. AREVA NP GmbH (Germany)
  4. CEA-Saclay, 91191 Gif-sur-Yvette Cedex (France)

This paper summarizes the developments implemented in the new APOLLO2.8 neutronics tool to meet the required target accuracy in LWR applications, particularly void effects and pin-by-pin power map in BWRs. The Method Of Characteristics was developed to allow efficient LWR assembly calculations in 2D-exact heterogeneous geometry; resonant reaction calculation was improved by the optimized SHEM-281 group mesh, which avoids resonance self-shielding approximation below 23 eV, and the new space-dependent method for resonant mixture that accounts for resonance overlapping. Furthermore, a new library CEA2005, processed from JEFF3.1 evaluations involving feedback from Critical Experiments and LWR P.I.E, is used. The specific '2005-2007 BWR Plan' settled to demonstrate the validation/qualification of this neutronics tool is described. Some results from the validation process are presented: the comparison of APOLLO2.8 results to reference Monte Carlo TRIPOLI4 results on specific BWR benchmarks emphasizes the ability of the deterministic tool to calculate BWR assembly multiplication factor within 200 pcm accuracy for void fraction varying from 0 to 100%. The qualification process against the BASALA mock-up experiment stresses APOLLO2.8/CEA2005 performances: pin-by-pin power is always predicted within 2% accuracy, reactivity worth of B4C or Hf cruciform control blade, as well as Gd pins, is predicted within 1.2% accuracy. (authors)

Research Organization:
The ASME Foundation, Inc., Three Park Avenue, New York, NY 10016-5990 (United States)
OSTI ID:
20995455
Resource Relation:
Conference: 14. international conference on nuclear engineering (ICONE 14), Miami, FL (United States), 17-20 Jul 2006; Other Information: Country of input: France
Country of Publication:
United States
Language:
English