Krypton atom and testing the limits of extreme-ultraviolet tunable-laser spectroscopy
- Forschungszentrum Karlsruhe, Institut fuer Meteorologie und Klimaforschung (IMK-IFU), Kreuzeckbahnstrasse 19, D-82467 Garmisch-Partenkirchen (Germany)
- Institute of Atomic and Molecular Sciences, Academia Sinica, P.O. Box 23-166, Taipei, Taiwan 10617 (China)
- Office of the President, Academia Sinica, Nankang, Taipei (China)
Measurements of several transitions in krypton carried out with a high-resolution extreme ultraviolet (xuv) laser source in 1987 were recently reanalyzed. This analysis, based on simulating the Doppler-broadened line shape of the iodine reference lines with new, greatly improved iodine reference data, yielded an order-of-magnitude improvement in the agreement between several {sup 86}Kr transition frequencies between 94.5 nm and 116.5 nm to {+-}5x10{sup -9}. The overall relative uncertainty is estimated to be {+-}6x10{sup -9}, which matches the best accuracies achieved in nanosecond short-wavelength experiments. The influence of frequency chirping in the pulsed dye amplifier chain was estimated to be rather low and to vary approximately between -7.1 MHz and +5.0 MHz for the three laser dyes used in this experiment. It is concluded that with an even more careful laser design the chirp-induced frequency shifts could be reduced to less than 1 MHz. Based on the analysis of the presumable chirp effects a correction for the {sup 86}Kr atlas by Kaufman and Humphries -0.055 53 cm{sup -1} is determined, which agrees with the result of a very recent two-photon experiment with frequency combs within just 0.000 46 cm{sup -1} (14 MHz), i.e., well within the combined errors of the three data sources involved in the intercomparison.
- OSTI ID:
- 20982100
- Journal Information:
- Physical Review. A, Vol. 75, Issue 2; Other Information: DOI: 10.1103/PhysRevA.75.022501; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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