Mass fractionation of carbon and hydrogen secondary ions upon Cs{sup +} and O{sub 2}{sup +} bombardment of organic materials
- Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695 (United States)
A phenomenon known as mass fractionation has been probed in organic materials using secondary ion mass spectrometry (SIMS). Mass fractionation occurs because two isotopes of a particular species (i.e., identical number of protons, but different number of neutrons) do not have identical secondary ion yields in a constant chemical environment. Two primary ion probes, Cs{sup +} and O{sub 2}{sup +}, have been utilized with detection of negative and positive secondary ions, respectively, using a magnetic sector mass spectrometer. These two analysis conditions have been found to yield considerably different mass fractionation effects as a result of different sputtering and ionization mechanisms. Also, as determined previously with SIMS analysis of inorganic materials, the lower molecular weight species carbon and hydrogen are particularly susceptible to mass fractionation effects. Because organic materials are primarily composed of carbon and hydrogen, and because isotopic labeling is often utilized to accurately analyze such materials, knowledge of these effects in organic materials is essential for quantitative SIMS analysis.
- OSTI ID:
- 20979367
- Journal Information:
- Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 25, Issue 3; Other Information: DOI: 10.1116/1.2718957; (c) 2007 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
- Country of Publication:
- United States
- Language:
- English
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