X-ray reflectivity studies of atomic-level surface-segregation in a liquid eutectic alloy of AuSn

Journal Article · Thu Mar 01 00:00:00 EST 2007 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PHYSREVB.75.104209· OSTI ID:20957765

Balagurusamy, Venkatachalapathy S. K.; Streitel, Reinhard; Pershan, P S ^[1]; Shpyrko, Oleg G ^[2]; Meron, Mati; Binhua, Lin ^[3]

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1. Department of Physics and DEAS, Harvard University, Cambridge, Massachusetts 02138 (United States)
2. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. CARS, University of Chicago, Chicago, Illinois 60637 (United States)

X-ray reflectivity studies reveal atomic-level surface-segregation at the free surface of the eutectic Au{sub 71}Sn{sub 29} liquid alloy. The surface-segregation extends up to three layers, in which the top layer is almost a pure monolayer of Sn, the second layer is almost a pure monolayer of Au and the third layer appears to be slightly enhanced in Au. Although the surface-segregation concentration profiles can be qualitatively accounted for by the theories of Defay-Prigogine and Strohl-King, they cannot satisfactorily account for the measured surface tension.

• OSTI ID: 20957765
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 75, Issue 10; Other Information: DOI: 10.1103/PhysRevB.75.104209; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
EUTECTICS
GOLD ALLOYS
LAYERS
LIQUIDS
REFLECTIVITY
SEGREGATION
SURFACE TENSION
SURFACES
TIN ALLOYS
X RADIATION