Structure of Liquid SiO{sub 2}: A Measurement by High-Energy X-Ray Diffraction

Journal Article · Fri Feb 02 00:00:00 EST 2007 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.98.057802· OSTI ID:20955431

Mei, Q ^[1]; Benmore, C J ^[1]; Weber, J K. R. ^[2]

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1. Intense Pulsed Neutron Source Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Containerless Research, Inc., Evanston, Illinois 60202 (United States)

The x-ray structure factor for liquid SiO{sub 2} has been measured by laser heating of an aerodynamically levitated droplet. The main structural changes of the melt compared to the room temperature glass are associated with an increase in the size of the SiO{sub 4} tetrahedra, indicating a small reduction in the average Si-O-Si bond torsion angle and an expansion of the network between 5 and 9 A ring . Strong directional bonds with little high temperature broadening and a high degree of intermediate range order are found to persist in the liquid state.

• OSTI ID: 20955431
• Journal Information: Physical Review Letters, Vol. 98, Issue 5; Other Information: DOI: 10.1103/PhysRevLett.98.057802; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHEMICAL BONDS
DROPLETS
LASER-RADIATION HEATING
SILICON OXIDES
STRUCTURE FACTORS
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
TORSION
X-RAY DIFFRACTION