Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography

Journal Article · Thu Mar 15 04:00:00 EDT 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2709742· OSTI ID:20953384

Zhanwei, Liu; Huimin, Xie; Daining, Fang; Fulong, Dai; Weining, Wang; Yan, Fang ^[1]

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1. Department of Mechanics, School of Science, Beijing Institute of Technology, Beijing 100081 (China) and FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084 (China)

In this article, a novel artificial submicro- or nanometer speckle fabricating technique is proposed by taking advantage of submicro or nanometer particles. In the technique, submicron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as submicro or nanometer speckle by using a scanning electronic microscope at a special magnification. In addition, an electron microscope speckle photography (EMSP) method is developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial submicro or nanometer speckles. The principle of artificial submicro or nanometer speckle fabricating technique and the EMSP method are discussed in detail in this article. Some typical applications of this method are offered. The experimental results verified that the artificial submicro or nanometer speckle fabricating technique and EMSP method is feasible.

• OSTI ID: 20953384
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 3 Vol. 78; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ADHESION
DEFORMATION
ELECTRON MICROSCOPES
NANOSTRUCTURES
PARTICLES
PHOTOGRAPHY
SCANNING ELECTRON MICROSCOPY
SURFACES