Compact electrostatic levitator for diffraction measurements with a two axis diffractometer and a laboratory x-ray source

Journal Article · Thu Feb 15 04:00:00 EST 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2435590· OSTI ID:20953271

Masaki, Tadahiko; Ishikawa, Takehiko; Paradis, Paul-Francois; Yoda, Shinichi; Okada, Junpei T; Watanabe, Yasuhiro; Nanao, Susumu; Ishikura, Akiko; Higuchi, Kensuke; Mizuno, Akitoshi; Watanabe, Masato; Kohara, Shinji ^[1]

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1. Japan Aerospace Exploration Agency, 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan)

A compact electrostatic levitator was developed for the structural analysis of high-temperature liquids by x-ray diffraction methods. The size of the levitator was 200 mm in diameter and 200 mm in height and can be set up on a two axis diffractometer with a laboratory x-ray source, which is very convenient in performing structural measurements of high-temperature liquids. In particular, since the laboratory x-ray source allows a great amount of user time, preliminary or challenging experiments can be performed with trial and error, which prepares and complements synchrotron x-ray experiments. The present small apparatus also provides the advantage of portability and facility of setting. To demonstrate the capability of this electrostatic levitator, the static structure factors of alumina and silicon samples in their liquid phases were successfully measured.

• OSTI ID: 20953271
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 2 Vol. 78; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALUMINIUM OXIDES
COMPACTS
EQUIPMENT
LIQUIDS
SILICON
STRUCTURE FACTORS
SYNCHROTRONS
X RADIATION
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS
X-RAY SOURCES