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Title: Spectroscopic comparison between 1200 grooves/mm ruled and holographic gratings of a flat-field spectrometer and its absolute sensitivity calibration using bremsstrahlung continuum

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.2437742· OSTI ID:20953255
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  1. Department of Fusion Science, Graduate University for Advanced Studies, Toki 509-5292, Gifu (Japan)

A flat-field extreme ultraviolet (EUV) spectrometer with a varied line spacing groove grating (1200 grooves/mm at grating center) has been developed to study the emission spectra from highly ionized medium Z impurities in large helical device (LHD). It covers a wavelength range of 50-500 A using a mechanically ruled grating, which was later replaced by a newly developed laminar-type holographic grating for comparative studies. Differences in spectral resolution, intensities of higher order spectra, and sensitivities of the spectrometer were studied between the two gratings by observing the emission spectra of LHD plasmas. Although the achieved resolution was alike between them, i.e., {delta}{lambda}{approx}0.24 A ring at 200 A, the holographic grating was much superior in suppressing the higher order light than the ruled grating. The relative sensitivity between the two gratings was evaluated using continuum radiation from LHD plasmas. As a result, it was found that the holographic grating has a flat response in the full wavelength range, but the sensitivity of the ruled grating drops sharply below 200 A. A new technique for the absolute calibration of the EUV holographic grating spectrometer was tried by combining the continuum radiation with a branching ratio of C IV lines (3p-3s: 5800 A/3p-2s: 312 A), and an accurate absolute sensitivity has been successfully obtained.

OSTI ID:
20953255
Journal Information:
Review of Scientific Instruments, Vol. 78, Issue 2; Other Information: DOI: 10.1063/1.2437742; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English