Simulations of Bragg diffraction of a focused x-ray beam by a single crystal with an epitaxial layer
- Russian Research Center 'Kurchatov Institute', 123182, Moscow (Russian Federation)
- Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York 14853 (United States)
The Bragg case diffraction of a narrow x-ray beam in a multilayer crystal is studied theoretically. The beam produced by a parabolic refractive lens is Bragg reflected by a crystalline sample and a spatial distribution of the intensity is recorded by a detector placed at the focus of the lens. This x-ray optical scheme represents a topographic technique which is extremely sensitive to a depth variation of a crystalline structure. Simulations of the intensity pattern were performed by using a computational technique based on a convolution of individual propagators by performing a double fast Fourier transform procedure. It was shown that each interface in a multilayer crystal can be observed on the intensity pattern with a contrast depending on the incident angle. Thus, by recording a series of images at different angles, valuable depth sensitive structural information can be obtained.
- OSTI ID:
- 20951529
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 75, Issue 22; Other Information: DOI: 10.1103/PhysRevB.75.224119; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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