Strain state evolution and thickness-dependent properties of epitaxial Nd{sub 0.7}Sr{sub 0.3}MnO{sub 3} films
- Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026 (China)
- Department of Modern Physics, University of Science and Technology of China, Hefei 230026 (China)
Nd{sub 0.7}Sr{sub 0.3}MnO{sub 3} (NSMO) films 7-300 nm thick have been grown on (001)(LaAlO{sub 3}){sub 0.3}(Sr{sub 2}AlTaO{sub 6}){sub 0.7} (LSAT) and (001)SrTiO{sub 3} (STO) substrates, with lattice mismatches of 0.33% and 1.29%, respectively. The strain state evolution was examined fully by x-ray reciprocal space maps, in order to clarify its impact on the thickness-dependent properties of the films. It was found that all NSMO/LSAT films are coherently strained, having almost the same Curie (T{sub C}) and peak resistivity (T{sub p}) temperatures at fixed thicknesses, while the NSMO/STO films evolve from being fully strained to relaxed, showing inhomogeneous magnetic transitions and lower or higher T{sub C} than their counterparts at 7-60 nm. The results underline that T{sub C} (T{sub p}) and phase separation are all controlled by the strain states of the films.
- OSTI ID:
- 20951511
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 75, Issue 21; Other Information: DOI: 10.1103/PhysRevB.75.212401; (c) 2007 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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