Decoupling refractive index and geometric thickness from interferometric measurements of a quartz sample using a fourth-order polynomial

Journal Article · Sun Jun 10 00:00:00 EDT 2007 · Applied Optics

DOI:https://doi.org/10.1364/AO.46.003498· OSTI ID:20929746

Ince, R; Hueseyinoglu, E

A Michelson interferometer setup was used to determine refractive index and thickness of afused-quartz sample with no knowledge of either parameter. At small angles,<10 deg. , theinterferometer equation follows a fourth-order polynomial in the sample refractive index alone,effectively decoupling the sample thickness from the equation. The incident angle of the He-Ne laserbeam versus fringe shift was fitted to the polynomial, and its coefficients obtained. These wereused to determine refractive index to within6x10-4 of the known value with an accuracy of {+-} 1.3%. Sample thickness was determined to an accuracy of {+-} 2.5%. Reproducibility of therotating table was determined to be {+-} 2x10-3 degrees.

• OSTI ID: 20929746
• Journal Information: Applied Optics, Vol. 46, Issue 17; Other Information: DOI: 10.1364/AO.46.003498; (c) 2007 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6935
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACCURACY
AMORPHOUS STATE
EQUATIONS
GLASS
INTERFEROMETRY
MICHELSON INTERFEROMETER
POLYNOMIALS
QUARTZ
REFRACTIVE INDEX
STANDARDS
TESTING
THICKNESS
VISIBLE RADIATION