Measurements of a Newly Designed BPM for the Tevatron Electron Lens 2

Journal Article · Mon Nov 20 04:00:00 EST 2006 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2401438· OSTI ID:20894950

Scarpine, V E; Kamerdzhiev, V; Fellenz, B; Olson, M; Kuznetsov, G; Kamerdzhiev, V; Shiltsev, V D; Zhang, X L ^[1]

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1. Fermi National Accelerator Laboratory, P.O. Box 500, Batavia, IL 60510 (United States)

Fermilab has developed a second electron lens (TEL-2) for beam-beam compensation in the Tevatron as part of its Run II upgrade program. Operation of the beam position monitors (BPMs) in the first electron lens (TEL-1) showed a systematic transverse position difference between short proton bunches (2 ns sigma) and long electron pulses ({approx}1 us) of up to {approx}1.5 mm. This difference was attributed to frequency dependence in the BPM system. The TEL-2 BPMs utilize a new, compact four-plate design with grounding strips between plates to minimize crosstalk. In-situ measurements of these new BPMs are made using a stretched wire pulsed with both proton and electron beam formats. In addition, longitudinal impedance measurements of the TEL-2 are presented. Signal processing algorithm studies indicate that the frequency-dependent transverse position offset may be reduced to {approx}0.1 mm for the beam structures of interest.

• OSTI ID: 20894950
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 868; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ALGORITHMS
BEAM BUNCHING
BEAM MONITORS
BEAM OPTICS
BEAM POSITION
DATA PROCESSING
ELECTRON BEAMS
FERMILAB TEVATRON
FREQUENCY DEPENDENCE
IMPEDANCE
LENSES
OPERATION
PROTON BEAMS