Solid-state reaction pathways of Sillenite-phase formation studied by high-temperature X-ray diffractometry and differential thermal analysis
This paper reports on the use of high-temperature X-ray diffractometry, in conjunction with differential thermal analysis, to study the solid-state reactions and phase transformations involved in and leading to the synthesis of various (bismuth oxide-based) Sillenite-type compounds. These, which have {gamma}-body centered cubic (bcc) structures related to {gamma}-Bi{sub 2}O{sub 3}, are generally represented by the formula Bi{sub 12}MO{sub 20}; here, the second cation M=Ge, Si, Ti, Zn, Al, as well as the two-cation combination (Si{sub 0.5}Ge{sub 0.5}). In each case, using the two techniques, measurements were performed on starting powder-mixtures of bismuth and cation M oxides, formulated with desired proportions to favor the Sillenite ({gamma}-)phase formation. Henceforth, the proceeding of solid-phase reactions and occurring of phase transitions, with rising temperature, were monitored and elucidated by the evolution of the X-ray diffractometry patterns and the appearance of thermal events in the differential thermal analysis curve, as both sets of results were also correlated.
- OSTI ID:
- 20884673
- Journal Information:
- Materials Research Bulletin, Vol. 38, Issue 5; Other Information: DOI: 10.1016/S0025-5408(03)00025-4; PII: S0025540803000254; Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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