Explosively Driven Shock Induced Damage in OFHC Copper
- Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)
OFHC Cu samples were subjected to shock loading using plane wave HE lenses to produce a uniaxial Taylor wave profile (shock followed by immediate release). Upon arrival of the shock wave at the free surface of the sample, the wave is reflected and propagates back into the sample as a release wave. It is the interaction of initial and reflected release waves that place the material in a localized state of tension which can ultimately result in damage and possibly complete failure of the material. The peak tensile stress and its location in the material are determined by the wave shape. Damage evolution processes and localized behavior are discussed based on results from time-resolved free surface velocity (VISAR) interferometry and post shock metallurgical analysis of the soft recovered samples.
- OSTI ID:
- 20875740
- Journal Information:
- AIP Conference Proceedings, Vol. 845, Issue 1; Conference: American Physical Society Topical Group conference on shock compression of condensed matter, Baltimore, MD (United States), 31 Jul - 5 Aug 2005; Other Information: DOI: 10.1063/1.2263393; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
Explosive-induced shock damage in copper and recompression of the damaged region
Damage Characterization in Copper Deformed under Hydrostatic Stress - Experimental Analysis