Fitting a free-form scattering length density profile to reflectivity data using temperature-proportional quenching
Journal Article
·
· Journal of Chemical Physics
- Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616 (United States)
A technique for fitting a free-form scattering length density profile to reflectivity data via least-squares minimization is presented. The approach combines aspects of simulated annealing with a parametrized representation of the scattering length density profile. The ability of the algorithm to accurately recover the scattering length density profile from arbitrary initial parameter values is demonstrated for simulated and experimental data.
- OSTI ID:
- 20864364
- Journal Information:
- Journal of Chemical Physics, Vol. 125, Issue 24; Other Information: DOI: 10.1063/1.2403126; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-9606
- Country of Publication:
- United States
- Language:
- English
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